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Automated Laser Diode/Bar Characterization & Testing Systems
- Measure devices from UV-LEDs to telecom laser diodes
- Modular construction
- High scalability and easy maintenance
- Easy operation
PRODUCT DESCRIPTION
ST-LDC systems are fully configurable,all-in-one laser diode and LED characterization devices for industries andR&D laboratories. They’re designed to measure and analyze all major characteristicsof laser diodes and LEDs in a fast and reproducible way. They’re ideal tool fordata sheet generation, quality control, failure analysis and researchactivities with semiconductor emitters.
ST-LDC systems are customizable tool to meetvarious needs required by different activities. They can measure devices fromUV-LEDs to telecom laser diodes and high power laser bars, we can features acamera assisted pick’n'place robot capable of collecting diodes from customersupplied trays and finally marking and sorting them after the tests.
ST-LDC systems are having modularconstruction based on robust field bus technology. This construction makes highscalability and easy maintenance possible while keeping number of componentsminimum.
On ST-LDC system without pick’n'placerobotics, devices under test (DUTs) are loaded into the system on multichannelload-traysthat are equipped with an individual low resistance bypass switch over each DUTto allow series connected devices operating even in case of open circuit orempty slots. Load tray also features channel specific temperature and voltagemonitors and optionally a channel specific temperature control.
ST-LDC capabilities
|
Value |
Remarks |
DUT type |
Laser diode, Laser bar, LED, HB LED, UHB LED |
Multiple DUT adapters are possible with single ST-LDC |
DUT current driver |
-> 0-500 mA (CW and/or pulsed) -> 0-5 A (CW and/or pulsed) -> 0-20A (CW and/or pulsed) -> 0-60A (CW and/or pulsed) -> 0-120A (CW and/or pulsed) -> 0-200A (pulsed only) -> 0-400A (pulsed only) |
Multiple drivers are possible within single ST-LDC |
Load-traysupport |
Yes |
|
Power measurement (LIV) |
0-200 W optical, 300 – 3000 nm |
Various accuracy and calibration options available |
Spectrum measurement |
200 – 2400 nm, resolution from 10 pm to 1 nm |
Based on OSA or spectrometer |
Far field measurement |
See ST-FFP specifications |
|
Visual ispection |
Near field integrity test |
Available as low and high power type |
DUT operating condition control |
-> TEC/peltier based, up to 30W cooling capacity per DUT, fast temperature variation possible -> Water cooled, up to 400W cooling capacity per DUT -> Nitrogen atmosphere optional -> Humidity control optional |
Microchannel DUT support only with water cooling |
By-emitter measurements |
Spectrum, LIV, Polarity |
Only laser for diode bars |
Throughput |
Depends on the ordered options, contact us to receive throughput calculations |
|
Dimensions |
1200 x 900 x 1500 mm |
|
Weight |
200 kg |
|
Power |
220-240 V AC 5 A |
|
Approvals |
CE |
|
ST- LDCrobo additionalcapabilities
|
Value |
Remarks |
DUT type |
Laser diode, Laser bar, LED, HB LED, UHB LED |
Multiple DUT adapters are possible with single ST-LDC |
Functions |
-> Locate and measure chip position -> Pick chip -> Align and place on testing bench -> Optionally mark chip -> Place chip: Back to the original tray, Sort to different trays, Discard |
|
Machine vision alignment |
Included |
|
Throughput (standard model) |
Up to 3 DUT per minute |
Time varies by the tests to be performed, contact us for calculation |
Throughput (high volume model) |
Up to 10 DUT per minute |
Tailor made system for specific testing needs, contact us for calculation |
Bare chip handling |
Yes |
DUT’s supplied in a Gel-pak™ |
Mounted chip handling |
Yes |
Customer specific DUT trays |
Available accuracy grades |
-> Basic: +/- 20 µm -> High: +/- 10 µm -> Extreme: +/- 1.25 µm |
|
Dimensions |
1200 x 900 x 1500 mm |
|
Weight |
200 kg |
|
Power |
220-240 V AC 5 A |
|
Approvals |
CE |
|
Software:
|
Value |
Remarks |
Operating software |
Measuretool |
|
Result viewer & analysis tool |
Result browser |
|
Common Measurement Database (CMDB) |
Yes |
|
Operating system |
Windows 7 32 bit |
Supplied within LDC computer (included) |
Optical Data analysis
|
Ith, Slope Efficiency, Wall plug efficiency |
|
Electrical |
Rs, Vbias |
|
Thermal |
T0, T1 |
|
Spectrum |
dλ/dT, SMSR, peak λ, FWHM |
|
Far field |
FWHM, Beam Steering |
|
Capabilities: